NSI-MI Technologies delivers advanced test solutions for characterization of antennas, radar reflectivity and radomes. Building upon this expertise, we also offer target simulation systems and precision motion equipment. Many of these system solutions can be highly customized to meet a customer requirement, while other system solutions can approach the definition of Commercial-Off-The-Shelf (COTS). The matrix below matches up NSI-MI system solutions to common customer requirements, in an attempt to show how our system solutions can be applied.
Are you going to AMTA? If so, come listen to John Wynne on Wednesday, November 7 from 3:30PM - 5:00PM as he presents an innovative approach to measuring radar systems in uncontrolled thermal environments.
Listen to Pat Pelland at AMTA on Thursday, November 8 at 8:30AM as he presents the second development phase of a new measurement technique to determine antenna system noise temperature using data acquired on a planar near-field scanner.
If you are attending ISAP, be sure to attend Dr. Daniël Janse van Rensburg's presentation on a spherical near-field scanner for measuring on-chip antennas. Save the date for Friday, October 26 fronm 8:50AM - 9:10AM. #ISAP
Listen to Scott McBride at the AMTA Symposium in Williamsburg, VA as he discusses a straightforward algorithm for creating images of stray signals in a range with a planar scanner. Mark your calendar as this is a presentation you won’t want to miss.